Agenda

The Nano-Aperture Ion SourceContinue

 

Lecturer: Gerward Weppelman (Charged Particle Opt...Continue

 

HCI interactive segmentation Human-computer intera...Continue

 

Save the date. More information will follow soon.Continue

 

Save the date. More information will follow soon.Continue

 

Charged Particle Optics

Our research group (Deeltjesoptica in Dutch) is operating in the field of charged particle optics, which means that we manipulate beams of electrons, positrons and ions.

Our ambition is to develop improved tools to look at the microscopic world and to invent new methods to create microscopic structures, even down to nanometer size. For that purpose we advance the fundamental understanding of relevant physical phenomena such as electron emission and we design innovative, sometimes revolutionary electron- and ion beam instruments, for the future semiconductor production, as well as for the fabrication of nanostructures. We presently hold the world record for the direct-writing of small structures using a focused electron beam.

Our research group CPO, directed by professor Pieter Kruit, belongs to the Department of Imaging Physics of the Faculty of Applied Sciences.


LATEST IMPHYS NEWS:

Jacob Hoogenboom in Library Online Magazine

24 March 2017

In the Online Magazine four scientists were interviewed about the help they received with their publications from the Open Access Fund. Jacob Hoogenboom about his publication on Time-resolved Cathodoluminescence Microscopy: Bart van Hulst about his publication on Healthcare Productivity: Jaap Nieuwenhuis about his publication on the Moderating Effect of Personality and Esin Komez about her...Continue

 

Freek van Rooijen finished his Bachelor

17 March 2017

Freek van Rooijen finished his Bachelor thesis "Analysis of the crosstalk in ultrasound matrix arrays" with a presentation and defence on the 16nd of March. Continue

 

Article published in Scientific Reports: "Automated sub-5 nm image registration in integrated correlative fluorescence and electron microscopy using cathodoluminescence pointers"

08 March 2017

Article demonstrating the registration (or overlay) of images obtained with light and electron microscopy with an accuracy of 5nm using an automated procedure was published March, 2 in Scientific Reports.Continue

 

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