Dissertations
Year | Group | Promotor | Name | Title |
2012 | AK | A. Gisolf | A. Schlesinger | Binaural model-based speech intelligibility enhancement and assessment in hearing aids |
2011 | DO AK | P. Kruit A. Gisolf | V. Castaldo A.K. Dey | |
AK | A. Gisolf/D.J. Verschuur | A.R. Ghazali | ||
AK | A. Gisolf/D.J. Verschuur | D.A. Chitu | ||
AK | A. Gisolf/D. de Vries | F. Melchior | Investigation on spatial sound design based on measured room impulse responses | |
AK | A. Gisolf/D. de Vries | J. van Dorp Schuitman | ||
2010 | AK | A. Gisolf/J.D. Jansen | Justyna Przybysz-Jarnut | Hydrocarbon Reservoir Parameter Estimation Using Production Data and Time-Lapse Seismic |
QI | L.J. van Vliet | F. Faas | ||
QI | L.J. van Vliet | M. Caan | ||
OP | H.P. Urbach | M. Cui | Distance Metrology in Air with a femtosecond Frequency Comb Laser | |
QI | S.M. Luthi/L.J. van Vliet | D. Tetyukhina | High-resolution reservoir characterization by seismic inversion with geological constraints | |
AK | A.J. Berkhout/D.J. Verschuur | G.J. van Groenestijn | ||
AK | A. Gisolf | L. Hörchens | ||
DO | P. Kruit | A. Dokania | ||
DO | E.W.J.M. van der Drift/P. Kruit | V.A. Sidorkin | Resist and Exposure Processes for Sub-10-nm Electron and Ion Beam Lithography | |
QI | L.J. van Vliet | K. van Wijk | ||
QI | L.J. van Vliet/J.L. Top | N. Koenderink | ||
OP | J.J.M. Braat/ H.P. Urbach | S. van Haver | The Extended Nijboer-Zernike Diffraction Theory and its Applications | |
OP | H.P. Urbach | M. Sluijter | Ray-Optics Analysis of Inhomogeneous Optically Anisotropic Media | |
OP | P.C.M. Planken | R. Chakkittakandy | ||
2009 | DO | P. Kruit | A.E. Grigorescu | Sub-10 nm resolution Electron Beam Lithography in ultrathin HSQ resist layers |
| QI | L.J.van Vliet/P. Jonker | J. Caarls | |
QI | I.T. Young /Y. Garini | H.R.C. Dietrich | ||
QI | I.T. Young /Y. Garini | B.J. Vermolen | ||
OP | H.P. Urbach | M. Xu | ||
OP | H.P. Urbach | M. van Turnhout | A Systematic Analysis of the Optical Merit Function Landscape | |
QI | L.J. van Vliet | A. van Eekeren | Super-Resolution of Moving Objects in Under-Sampled Image Sequences | |
2008 | QI | I.T. Young/Y. Garini | M.W. Docter | |
DO | P. Kruit | Y. Zhang | A 100-electron-beam source from a high brightness Schottky emitter for fast patterning applications | |
| QI | I.T. Young/Y. Garini | G.O.F. Parikesit | Nanofluidic electrokinetics in quasi-two-dimensional branched U-turn channels |
QI | L.J. van Vliet/ | F. de Jong | Range Imaging and Visual Servoing for Industrial Applications | |
| DO | P. Kruit | W.F. van Dorp | |
| DO | P. Kruit | M. van Bruggen | Multi-electron beam system for high resolution electron beam induced deposition |
| OP | J.J.M. Braat | J. van den | |
| QI | L.J. v. Vliet/ | W. Caarls | Automated Design of Application-Specific Smart Camera Architectures |
| OP | J.J.M. Braat | A.M. Nugrowati | Vectorial Diffraction of Extreme Ultraviolet Light and Ultrashort Light Pulses |
| OP | J.J.M. Braat | J. Spronck | The Role of Amplitude, Phase, Polarization and their Interconnection in Nulling Interferometry |
2007 | AK | A. Gisolf | N. Pörtzgen | Imaging of Defects in Girth Welds using Inverse Wave Field Extrapolation of Ultrasonic Data |
| AK | A. Gisolf | S. Tegtmeier | |
| AK | A.J.Berkhout/ | K. Hindriks | Estimation and Removal of Complex Near Surface Effects in Seismic Measurements |
| AK | A.J.Berkhout/A.Gisolf | M.N. Al-Ali | Land seismic data acquisition and preprocessing an operator solution to the near-surface problem |
| AK | A.Gisolf/D.J.Verschuur | M.v.d. Rijzen | One-step Estimation of Focusing Operators for 3D Seismic Data |
| QI | L.J.v.Vliet | I.W.O. Serlie | |
| OP | J.J.M.Braat | F. Zijp | |
| OP | H.P.Urbach | J. Brok | |
2006 | OP | J.J.M. Braat | W.D. Koek | Holographic particle image velocimetry using bacteriorhodopsin |
AK | A.J. Berkhout | E. van Veldhuizen | ||
| AK | A. Gisolf | J. Groen | |
| QI | I.T. Young | S. Persa | |
| QI | I.T. Young | Suprijanto | Image Processing for Monitoring Locally Induced Hyperthermia with Magnetic Resonance Imaging |
| OP | J.J.M. Braat | C.v.d. Avoort | |
| OP | J.J.M. Braat | O.E. Marinescu | Novel Design Methods for High-Quality Lithographic Objectives |
| DO | P. Kruit | V.N. Tondare | Towards a High Brightness, Monochromatic Electron Impact Gas Ion Source |
| QI | L.J. van Vliet | I.R. Rabelo | 3D Geological Object Recognition in High-Reolution Seismic Data |
| QI | L.J. van Vliet | Q.T. Pham | Spatiotonal adaptivity in Super-Resolution of under-sampled image sequences |
| OP | J.J.M. Braat | B. Swinkels | |
| QI | L.J. van Vliet | K.A. Vermeer | Computer-aided assessment of glaucoma in scanning laser polarimety |
| OP | J.J.M. Braat | E.M. Vuelban | Adaptive Optics. A liquid deformable mirror for high-order wavefront correction |
2005 | QI | I.T. Young /R. Duin | E. Pekalska | Dissimilarity representations in pattern recognition |
| AK | A.v.d. Bos / | M. Tolsma | |
| DO | P. Kruit | R. van Aken | Low-energy electron beams through ultra-thin foils, applications for electron microscopy |
| OP | J.J.M. Braat | A. Serebriakov | |
| OP | J.J.M. Braat | A.S. van de Nes | Rigorous Electromagnetic Field Calculations for Advanced Optical Systems |
| OP | J.J.M. Braat | N.C.J. van der Valk | |
| AK | A. Gisolf | P.M. Zwartjes | |
2004 | PH=QI |
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| QI | L.J.v. Vliet | B. Rieger | |
| QI | L.J. v. Vliet | C.L. Luengo Hendriks | |
| QI | I.T.Young/ | A. Epstein | |
| QI | I.T.Young/ | J. Dijk | In search of an Objective Measure for the Perceptual Quality of Printed Images |
| AK | A.J.Berkhout/ | B.E. Cox | |
| QI | I.T. Young | G. Polder | Spectral imaging for measuring biochemicals in plant material |
| OP | J.J.M. Braat | I. Montilla | |
| QI | I.T.Young/P. Jonker | J. Han | Fault-Tolerant Architectures for Nanoelectronic and Quantum Devices |
| OP | J.J.M. Braat | M.L. Krieg | Absolute Heterodyne Interferometer for Strongly Aspherical Mirrors |
| AK | A.J. Berkhout /A. Gisolf | W.P.J. de Bruijn | |
| AK | A.J. Berkhout /D. de Vries | E.M. Hulsebos | |
2003 | OP | J. Braat | M.F. Bal | Next-generation extreme ultraviolet lithographic projection systems |
| OP | J. Braat | A. Mieremet | |
| OP | J. Braat | S.M. Booij | |
| PH | L.J. v. Vliet | C. Soviany | Embedding data and task parallelism in image processing applications |
| AK | A.J. Berkhout/ | J.F.B.Bolte | Estimation of focussing operators using the Common Focal Point method. |
2002 | AK | A.J. Berkhout | E.J. van Dedem | |
| AK | A.J. Berkhout/ G. Blacquiere | A.W.F. Volker | Assessment of 3-D seismic acquistion geometries by focal beam analysis |
| AK | F.A. Bilzen | E. Langendijk | |
| DO | P. Kruit | D. Nijkerk | |
| DO | P. Kruit | N. Silvis-Cividjian | |
| PH | L. J. van Vliet | P. Bakker | |
| PH | L.J. v. Vliet/ I.T. Young | L.R. van den Doel | Quantitative microscopic techniques for monitoring dynamic processes in microarrays |
| PH | L.J. v. Vliet/ I.T. Young | M. van Ginkel | Image Analysis using orientation space based on steerable filters |
2001 | AK | C.P.A. Wapenaar/ | K.M. Schalkwijk | Decompostion of multicomponent ocean-bottem data into P- and S-Waves |
| OP | H. Frankena | P. Maat | |
| OP | J. Braat | R. Klaver | Novel interferometer to measure the figure of strongly aspherical mirrors |
| PH | I.T. Young | D.M.J. Tax | |
| PH | I.T. Young | J.G.E. Olk | |
| PH | I.T. Young | M. Skurichina | |
| PH | L.J.v. Vliet | A. Ypma | Learning methods for machine vibration analysis and health monitoring |
| PH | L.J.v. Vliet | D. de Ridder | |
2000 | AK | G. Berkhout | I. Merks | Binaural application of microphone arrays for improved speech intelligibility in a noisy environment |
| AK | J.T. Fokkema/ | M. Dillen | |
| AK | A.J. Berkhout | J.J. Sonke | |
| AK | A.J. Berkhout/ | F. Verhelst | |
| AK | A.J. Berkhout/C.P.A. Wapenaar | J. Vos | Characterization of Laminated construction materials based on ultrasonic reflection measurements |
| DO | P. Kruit | H.W. Mook | |
| PH | I.T. Young | M. de Bakker | |
| PH | I.T. Young/L.J.v. Vliet | S.L. Ellenberger | |
| PH | I.T. Young | T.W. Fens | Petrophysical Properties from small rock samples using Image Analysis techniques |
1999 | DO | P. Kruit | M. Fransen | |
| DO | P. Kruit | B. Mertens | |
| OP | H. Frankena/J. Braat | L.A. d’Arcio | |
| PH | I.T. Young | G.M.P. van Kempen | |
| PH | I.T. Young | F. Boddeke |

