Article published in Scientific Reports: "Automated sub-5 nm image registration in integrated correlative fluorescence and electron microscopy using cathodoluminescence pointers"

08 March 2017 by ImPhys Webmaster

Article demonstrating the registration (or overlay) of images obtained with light and electron microscopy with an accuracy of 5nm using an automated procedure was published March, 2 in Scientific Reports.

In the biological sciences, data from fluorescence and electron microscopy is correlated to allow fluorescence biomolecule identification within the cellular ultrastructure and/or ultrastructural analysis following live-cell imaging. High-accuracy (sub-100 nm) image overlay requires the addition of fiducial markers, which makes overlay accuracy dependent on the number of fiducials present in the region of interest. Here, we report an automated method for light-electron image overlay at high accuracy, i.e. below 5 nm. Our method relies on direct visualization of the electron beam position in the fluorescence detection channel using cathodoluminescence pointers. We show that image overlay using cathodoluminescence pointers corrects for image distortions, is independent of user interpretation, and does not require fiducials, allowing image correlation with molecular precision anywhere on a sample.

You can read the article here.

© 2017 TU Delft

Metamenu