Prof. dr. ir. L.J. van Vliet

Telefoon: +31 (0)15 27 87989
E-mail:L.J.vanVliet@remove-this.tudelft.nl
Postadres: Lorentzweg 1 2628CJ Delft
Kamernummer: F 234
Faculteit: Technische Natuurwetenschappen
Afdeling: Imaging Science & Technology
Sectie: Quantitative Imaging

Profiel

Lucas J. van Vliet (1965) is a full professor in Multi-dimensional data analysis at the faculty of Applied Sciences of the Delft University of Technology in The Netherlands. He studied Applied Physics (M.Sc. in 1988) and obtained his Ph.D. cum laude in 1993. His thesis entitled "Grey-scale measurements in multi-dimensional digitized images" presents novel methods for sampling-error free measurements of geometric object features. He has worked on various sensor, restoration and measurement problems in quantitative microscopy. His current research interest include segmentation and analysis of objects, textures and structures in multi-dimensional digitized images from a variety of imaging modalities. In 1996 he was awarded a fellowship of the Royal Netherlands Academy of Arts and Sciences (KNAW).

Onderzoeks interesses  

Publicaties